Titlebook: Scanning Electron Microscopy; Physics of Image For Ludwig Reimer Book 19851st edition Springer-Verlag Berlin Heidelberg 1985 Rasterelektron

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Imaging with Secondary and Backscattered Electrons,ields, which create type-1 magnetic and voltage contrast, respectively. By employing pre-acceleration and a spectrometer the voltage contrast can be used to make a quantitative measurement of the surface bias.

Hemodialysis

Elemental Analysis and Imaging with X-Rays,ce can also be used quantitatively in SEM for normal and tilted specimens. For small particles and films on substrates and for biological specimens, special correction problems have to be taken into account. X-ray fluorescence analysis can be employed in SEM at some sacrifice of spatial resolution.