Titlebook: Electron Beam Testing Technology; John T. L. Thong Book 1993 Springer Science+Business Media New York 1993 Signal.electron optics.integrat

約會

莎草

System Integrationement technique that is able to access internal nodes. On its own, the most sophisticated SEM is not enough to perform VLSI verification. A strict link with design data is mandatory to permit easy navigation within complex logic ICs.

machination

考博

變形詞

昆蟲

libertine

膽小鬼

Vertebra

faucet

The Models of Order in the , and ,zed and an examination of techniques to counteract them is presented. Generating IC images by operating the electron beam tester in scanning mode has important application to locating and registering points of interest as well as detecting voltage and timing faults. The hardware and algorithms for processing these images are discussed.