Titlebook: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide; Trent McConaghy,Kristopher Breen,Amit Gupta Book 2013 Spring

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide978-1-4614-2269-3

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3-Sigma Verification and Design,acteristics. It then describes the key algorithms needed to enable the sigma-driven corner flow, namely sigma-driven corner extraction and confidence-based statistical verification. Some enabling technologies include Monte Carlo, Optimal Spread Sampling, confidence intervals, and 3σ corner extraction.

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Conclusion, coverage, to design precisely for 3-sigma statistical design, or to achieve true high-sigma statistical designs without unnecessarily spinning silicon or over-margining. Being able to select and apply an appropriate methodology is an important component of being able to deliver competitive, high yield products reliably and on time.

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High-Sigma Verification and Design,le results for representative high-sigma designs, revealing some of the key traits that make the HSMC technology effective. It describes how to extract full PDFs from ?6 to +6 sigma, for application to statistical system-level analysis (e.g. for memory arrays). Finally, it presents industrial design examples.