找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: VLSI-SoC: Research Trends in VLSI and Systems on Chip; Fourteenth Internati Giovanni Micheli,Salvador Mir,Ricardo Reis Conference proceedin

[復(fù)制鏈接]
樓主: patch-test
41#
發(fā)表于 2025-3-28 17:05:07 | 只看該作者
Conference proceedings 2008design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI- SOC conferences aim to address these exciting new issues.
42#
發(fā)表于 2025-3-28 20:54:44 | 只看該作者
VLSI-SoC: Research Trends in VLSI and Systems on ChipFourteenth Internati
43#
發(fā)表于 2025-3-29 02:13:58 | 只看該作者
44#
發(fā)表于 2025-3-29 06:58:41 | 只看該作者
45#
發(fā)表于 2025-3-29 10:23:13 | 只看該作者
Innovative Optoeletronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices,s a new approach for the development of integrated molecular analysis. The technique presented hereafter combine a labelfree method for molecular characterization based on UV absorbance and two technologies of silicon photodetectors addressed to fulfill the requirements of different applications.
46#
發(fā)表于 2025-3-29 14:24:21 | 只看該作者
Electronic Detection of DNA Adsorption and Hybridization,or arrays is achieved by deposition with a microspotting device or specific hybridization between complementary oligonucleotide sequences. The current voltage characteristics of the transistors are measured with the sample surface immersed in aqueous solution. The chapter provides a brief overview o
47#
發(fā)表于 2025-3-29 17:59:07 | 只看該作者
48#
發(fā)表于 2025-3-29 21:39:23 | 只看該作者
A CMOS Mixed-Mode Sample-and-Hold Circuit for Pipelined ADCs,t consists of a switched-capacitor (SC) amplifier and a comparator to generate the mixed-mode sampled output data, which are represented both in analog and digital forms. The mixed-mode sampling technique reduces the operational amplifier (op amp) output swing. As a result, the requirements on op am
49#
發(fā)表于 2025-3-30 03:16:44 | 只看該作者
50#
發(fā)表于 2025-3-30 05:26:39 | 只看該作者
Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact oerformance, without requiring significant additional design effort. Scaling past the 45 nm technology node, however, brings a number of problems whose impact on system level design has not been evaluated yet. Random intra-die process variability, reliability degradation mechanisms and their combined
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-5 13:05
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
兴山县| 长白| 黄陵县| 翼城县| 全南县| 富源县| 遂溪县| 慈利县| 中宁县| 公安县| 工布江达县| 景东| 荣成市| 洛扎县| 桂林市| 滁州市| 乐至县| 肇东市| 汕头市| 丘北县| 阿城市| 当阳市| 孝感市| 江山市| 雷波县| 马尔康县| 罗城| 铁岭市| 穆棱市| 汕头市| 苏尼特右旗| 赤峰市| 海盐县| 青州市| 汕尾市| 安丘市| 鄂温| 巴林右旗| 开封县| 新民市| 双辽市|