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Titlebook: Surfaces Algebriques; Seminaire de Geometr Jean Giraud,Luc Illusie,Michel Raynaud Conference proceedings 1981 Springer-Verlag Berlin Heidel

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21#
發(fā)表于 2025-3-25 05:26:40 | 只看該作者
22#
發(fā)表于 2025-3-25 09:28:15 | 只看該作者
G. Rousseaun. This microscope represents a significant improvement over the existing scanning SQUID techniques and is expected to be able to image the spin of a single electron..978-3-642-43152-4978-3-642-29393-1Series ISSN 2190-5053 Series E-ISSN 2190-5061
23#
發(fā)表于 2025-3-25 15:07:09 | 只看該作者
agnetic, and chemical properties of diverse materials includ.The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers,
24#
發(fā)表于 2025-3-25 19:38:29 | 只看該作者
25#
發(fā)表于 2025-3-25 22:46:51 | 只看該作者
26#
發(fā)表于 2025-3-26 00:44:08 | 只看該作者
J. Giraudy and to characterize atoms and molecules on surfaces and how it is that the scanning tunneling microscope images these surfaces and adsorbates will be discussed. We have extended the capabilities of scanning probe microscopes in several ways; two in particular will be highlighted. In the first sect
27#
發(fā)表于 2025-3-26 05:09:12 | 只看該作者
28#
發(fā)表于 2025-3-26 09:48:43 | 只看該作者
P. Deligne,L. Illusiecale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution
29#
發(fā)表于 2025-3-26 13:45:36 | 只看該作者
N. Katzff force spectroscopy (PFS)] in order to deduce the local dielectric and polarization properties on functional ferroelectric PZT thin films both at outer and inner interfaces with a lateral resolution of better than 50 nm. We show that the polarization profile into the depth of the PZT sample varies
30#
發(fā)表于 2025-3-26 18:46:25 | 只看該作者
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