Titlebook: Surface and Interface Characterization by Electron Optical Methods; A. Howie,U. Valdrè Book 1988 Springer Science+Business Media New York

產(chǎn)生

Profile Imaging of Small Particles, Extended Surfaces and Dynamic Surface Phenomena,gements and a variety of surface reactions can be observed. In this chapter, the electron microscopical approaches to imaging surfaces are described and the various types of surface information available are compared. The results of profile imaging studies of small particles, surfaces and dynamic su

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adjacent

PANG

變形

jarring

Book 1988 results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at

CLAP

艦旗

CUB

Reflection Electron Microscopy,ed on the specimen, the diffraction and microanalysis data may be obtained from very small regions of the surface. In this chapter, we give accounts of the current status of the techniques involved and of some recent applications.

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