Titlebook: Resilient Architecture Design for Voltage Variation; Vijay Janapa Reddi,Meeta Sharma Gupta Book 2013 Springer Nature Switzerland AG 2013

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1935-3235 , caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectu

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Vijay Janapa Reddi,Meeta Sharma Guptaive one by linking various types of knowledge, such as seeking relations between various geological structures as well as between earlier thoughts or views and contemporary approaches..978-3-319-35205-3978-3-319-02496-7Series ISSN 2364-6438 Series E-ISSN 2364-6446

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Vijay Janapa Reddi,Meeta Sharma Guptaive one by linking various types of knowledge, such as seeking relations between various geological structures as well as between earlier thoughts or views and contemporary approaches..978-3-319-35205-3978-3-319-02496-7Series ISSN 2364-6438 Series E-ISSN 2364-6446

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Introduction,nominal and worst-case operating conditions in modern microprocessor designs grows, the inefficiencies of worst-case design are too large to ignore. Recognizing the inefficiencies in such a design style, researchers have begun to propose architecture-level solutions that address worst-case condition

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Book 2013find the information useful since tolerance, avoidance, and elimination are generalizable constructsthat can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / T