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Titlebook: Research Perspectives and Case Studies in System Test and Diagnosis; John W. Sheppard,William R. Simpson Book 1998 Springer Science+Busine

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樓主: vein220
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發(fā)表于 2025-3-23 12:49:39 | 只看該作者
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發(fā)表于 2025-3-23 15:58:20 | 只看該作者
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發(fā)表于 2025-3-23 21:00:00 | 只看該作者
Fault Hypothesis Computations Using Fuzzy Logic, outcomes from a test as well as information from multiple tests. The chapter deals with two types of uncertainty: test outcome uncertainty and test inference uncertainty. The issues of conflict detection and mitigation, and rehabilitation of conclusions are addressed.
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發(fā)表于 2025-3-24 01:09:37 | 只看該作者
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發(fā)表于 2025-3-24 05:11:17 | 只看該作者
Diagnostic Inaccuracies: Approaches to Mitigate,intenance seldom consider these factors. These inaccuracies lead to occurrences of false alarm, false assurance and field cannot duplicate events and Re-Test OK. Understanding the base causes and how to approach resolution will assist in the development of diagnostic and repair strategies.
16#
發(fā)表于 2025-3-24 09:57:52 | 只看該作者
Inducing Diagnostic Inference Models from Case Data,n this chapter, we discuss an approach to analyzing a diagnostic case base and inducing a compact knowledge base using the diagnostic inference model with which efficient diagnostics can be performed. We then apply an approach to reasoning using Dempster-Shafer theory to improve the diagnostics further with the resultant model.
17#
發(fā)表于 2025-3-24 13:45:10 | 只看該作者
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發(fā)表于 2025-3-24 17:06:38 | 只看該作者
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發(fā)表于 2025-3-25 00:30:06 | 只看該作者
,Pass/Fail Limits—The Key to Effective Diagnostic Tests,Pass/Fail limits to discriminate among suspected failures in a known faulty circuit and improving test outcome confidence. Analog circuit simulations serve to illustrate failed circuit behavior characteristics and the effect of assigning multiple Pass/Fail limits to a single test setup for improved
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