Titlebook: Reliability of Nanoscale Circuits and Systems; Methodologies and Ci Milo? Stanisavljevi?,Alexandre Schmid,Yusuf Lebleb Book 2011 Springer S

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書目名稱Reliability of Nanoscale Circuits and Systems影響因子(影響力)




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Reliability Evaluation Techniques,odevices, make them susceptible to transient failures and negatively impact on reliability. Architectures built from emerging nanodevices will be extremely susceptible to parameter variations, fabrication defects, and transient failures induced by environmental/external causes [2, 164].

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Book 2011eliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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Reliability Evaluation Techniques,easons for this behavior. In particular, as feature sizes are aggressively scaled, the processing of ICs becomes more complex and inevitably introduces more defects. Other factors such as geometric variations, or related to the tiny amounts of energy which are required to enable the switching of nan

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Averaging Design Implementations,One of the fundamental properties of averaging lies in the fact that it reduces the spread of output values caused by different stochastic processes, which are inherently present in hardware designs. In addition, adaptable and reconfigurable designs provide better response in situations outside of t