Titlebook: Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing; Jeffrey Prinzie,Michiel Steyaert,Paul Leroux Book 2018 Sprin

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Radiation Effects in CMOS Technology,This chapter will introduce the radiation effects that are encountered in modern CMOS technologies that have been used in this work. A summary of the effects and the potential problems will be discussed.

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Jeffrey Prinzie,Michiel Steyaert,Paul LerouxBased on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research.Describes in detail advanced techniques to harden circuits against ioniz

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978-3-030-08745-6Springer International Publishing AG, part of Springer Nature 2018

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Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing978-3-319-78616-2Series ISSN 1872-082X Series E-ISSN 2197-1854

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https://doi.org/10.1007/978-3-319-78616-2Radiation-Tolerant Circuits; Radiation-hardened circuits; Soft errors; Fault-tolerant design; Radiation

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Radiation Experiments on CMOS PLLs,which are measured using X-rays. In total, two chips were irradiated to compare their results. Next, the single-event sensitivity of the circuits is discussed through measurements done with heavy ions and laser experiments. Finally, a brief discussion is done on the practical aspects of the setup.

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