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Titlebook: Radiation Effects on Embedded Systems; RAOUL VELAZCO,PASCAL FOUILLAT,RICARDO REIS Book 2007 Springer Science+Business Media B.V. 2007 Radi

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樓主: Orthosis
11#
發(fā)表于 2025-3-23 12:21:35 | 只看該作者
Raoul Velazco,Fabien Faurervable Universe. As a result, numerical relativity has recently become a major field of research, and Elements of Numerical Relativity and Relativistic Hydrodynamics is a valuable primer for both graduate students and non-specialist researchers wishing to enter the field...A revised and significantl
12#
發(fā)表于 2025-3-23 15:10:09 | 只看該作者
13#
發(fā)表于 2025-3-23 18:16:01 | 只看該作者
14#
發(fā)表于 2025-3-23 22:20:49 | 只看該作者
http://image.papertrans.cn/r/image/820434.jpg
15#
發(fā)表于 2025-3-24 03:48:04 | 只看該作者
https://doi.org/10.1007/978-1-4020-5646-8Radiation Effects; Radiation ground testing; Signal; analog; circuit; electronics; embedded systems; fault
16#
發(fā)表于 2025-3-24 07:35:54 | 只看該作者
978-90-481-7417-1Springer Science+Business Media B.V. 2007
17#
發(fā)表于 2025-3-24 12:32:35 | 只看該作者
18#
發(fā)表于 2025-3-24 15:58:33 | 只看該作者
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing,This paper describes use the of a pulsed laser for studying radiationinduced single-event effects in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event upsets in memories.
19#
發(fā)表于 2025-3-24 21:45:08 | 只看該作者
20#
發(fā)表于 2025-3-25 02:02:08 | 只看該作者
Multi-level Fault Effects Evaluation,rmed at different steps of the design process. In this work we report and overview of fault injection, discussing which techniques are available that can be used starting from the early conception of the system and arriving to the transistor level.
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