Titlebook: Quantitative X-Ray Diffractometry; Lev S. Zevin,Giora Kimmel,Inez Mureinik Book 1995 Springer-Verlag New York, Inc. 1995 Powder diffractio

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Geometric aspects of X-ray diffractometry,e range of scattering angles, and thus a diffraction pattern is produced. There is a limited time (usually seconds) in which to measure the intensity of the narrow diffraction peak in comparison with minutes or even hours of exposure time in a simultaneously operated unit—a Debye-Sherrer camera. Whe

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Practical aspects of quantitative phase analysis,the practical realization of the theoretical concepts outlined earlier. In other words, we have to delineate the techniques and conditions required to carry out this task with acceptable precision and accuracy. The quantity that we actually measure is the diffraction intensity, and the objective in

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Book 1995ue, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this

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Physical basis, of the layer:.where I is the intensity of the beam at the boundary of the layer facing the X-ray source, Δx is the thickness of the layer, and μ is a proportional coefficient, known as the coefficient of attenuation.

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