| 書(shū)目名稱(chēng) | Noncontact Atomic Force Microscopy |
| 編輯 | S. Morita,R. Wiesendanger,E. Meyer |
| 視頻video | http://file.papertrans.cn/668/667213/667213.mp4 |
| 概述 | This book is a top state-of-the-art report on all the methods in noncontact atomic force microscopy prepared by the leading experts in the field.Includes supplementary material: |
| 叢書(shū)名稱(chēng) | NanoScience and Technology |
| 圖書(shū)封面 |  |
| 描述 | Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues. |
| 出版日期 | Book 2002 |
| 關(guān)鍵詞 | AFM; Bias; Helium-Atom-Streuung; Noncontact atomic; True atomic resolution; deformation; experiment; measur |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-56019-4 |
| isbn_softcover | 978-3-642-62772-9 |
| isbn_ebook | 978-3-642-56019-4Series ISSN 1434-4904 Series E-ISSN 2197-7127 |
| issn_series | 1434-4904 |
| copyright | Springer-Verlag Berlin Heidelberg 2002 |
|Archiver|手機(jī)版|小黑屋|
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