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Titlebook: New Trends in Nonlinear Dynamics; Proceedings of the F Walter Lacarbonara,Balakumar Balachandran,Gabor St Conference proceedings 2020 Sprin

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樓主: Falter
11#
發(fā)表于 2025-3-23 12:03:54 | 只看該作者
Shaotao Zhu,Jing Li,Ji Zhou,Tingting Quanre extensivelydiscussed. Non-traditional approaches as well as semi-automatedtechniques to combat substrate noise are also addressed. ..Substrate Noise: Analysis and Optimization for IC Design. will beof interest to researchers and professionals interested in signalintegrity, as well as to mixed signal and RF978-1-4757-7439-9978-0-306-48171-0
12#
發(fā)表于 2025-3-23 15:37:25 | 只看該作者
Federica Mezzani,Amir Sajjad Rezaei,Antonio Carcaterravelydiscussed. Non-traditional approaches as well as semi-automatedtechniques to combat substrate noise are also addressed. ..Substrate Noise: Analysis and Optimization for IC Design. will beof interest to researchers and professionals interested in signalintegrity, as well as to mixed signal and RF
13#
發(fā)表于 2025-3-23 19:44:28 | 只看該作者
14#
發(fā)表于 2025-3-23 23:34:27 | 只看該作者
15#
發(fā)表于 2025-3-24 04:57:31 | 只看該作者
16#
發(fā)表于 2025-3-24 09:42:24 | 只看該作者
Kurpa Lidiya,Shmatko Tetyana,Jan Awrejcewiczate noise. A second, more complex experimental ASIC has been designed, an 86-Kgate digital multirate filterbank with several noise sensor amplifiers, to analyze substrate noise generation in a real digital telecom ASIC and to investigate the influence of the different substrate noise coupling mechan
17#
發(fā)表于 2025-3-24 14:18:36 | 只看該作者
Vyacheslav N. Burlayenko,Tomasz Sadowski,Svetlana D. Dimitrovagn ?ow is built, calibrated to silicon and used as part of the design and validation ?ows to uncover and ?x substrate coupling problems in RF ICs. The ?ow is used to develop a comprehensive RF substrate noise isolation design guide to be used by RF designers during the ?oor planning, circuit design
18#
發(fā)表于 2025-3-24 15:26:23 | 只看該作者
19#
發(fā)表于 2025-3-24 22:51:26 | 只看該作者
Jinghua Zhang,Shuai Chen,Like Chengn ?ow is built, calibrated to silicon and used as part of the design and validation ?ows to uncover and ?x substrate coupling problems in RF ICs. The ?ow is used to develop a comprehensive RF substrate noise isolation design guide to be used by RF designers during the ?oor planning, circuit design
20#
發(fā)表于 2025-3-25 00:23:04 | 只看該作者
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