Titlebook: Nanotribology and Nanomechanics; An Introduction Bharat Bhushan Textbook 20051st edition Springer-Verlag Berlin Heidelberg 2005 Adhesion, F

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Scanning Probe Microscopy — Principle of Operation, Instrumentation, and Probes the pure imaging capabilities of SPM techniques is dominated by the application of these methods at their early development stages, the physics of probe—sample interactions and the quantitative analyses of tribological, electronic, magnetic, biological, and chemical surfaces have now become of incr

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Noncontact Atomic Force Microscopy and Its Related Topicsocess. In Sect. 4.2, the principles of AFM such as operating modes and the frequency modulation method of the NC-AFM are fully explained. Then, in Sect. 4.3, applications of NC-AFM to semiconductors that make clear its potentials such as spatial resolution and functions are introduced. Next, in Sect

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Low Temperature Scanning Probe Microscopyallow the measurement of physical properties down to the nanometer scale. Some techniques, such as the scanning tunneling microscope and the scanning force microscope even go down to the atomic scale. The properties that are accessible are various. Most importantly, one can image the arrangement of

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Dynamic Force Microscopyr contact mode AFM is a widespread technique to obtain nanometer resolution images on a wide variety of surfaces, true atomic resolution imaging is routinely observed only in the dynamic mode. We will explain the jump-to-contact phenomenon encountered in static AFM and present the dynamic operationa

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Friction and Wear on the Atomic Scale the school of . and . have revealed that macroscopic friction can be related to the collective action of small asperities. During the last 15 years, experiments performed with the atomic force microscope gave new insight into the physics of single asperities sliding over surfaces. This development,

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