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Titlebook: Nanoelectronic Coupled Problems Solutions; E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber Book 2019 Springer Nature Switzerland AG 201

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發(fā)表于 2025-3-21 19:15:48 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Nanoelectronic Coupled Problems Solutions
編輯E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber
視頻videohttp://file.papertrans.cn/661/660720/660720.mp4
概述Combines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault Simulation.Uniq
叢書名稱Mathematics in Industry
圖書封面Titlebook: Nanoelectronic Coupled Problems Solutions;  E. Jan W. ter Maten,Hans-Georg Brachtendorf,Herber Book 2019 Springer Nature Switzerland AG 201
描述.Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:..?(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; ..(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimizatio
出版日期Book 2019
關(guān)鍵詞multirate; model order reduction; co-simulation; uncertainty quantification; power-MOS devices; RF-circui
版次1
doihttps://doi.org/10.1007/978-3-030-30726-4
isbn_softcover978-3-030-30728-8
isbn_ebook978-3-030-30726-4Series ISSN 1612-3956 Series E-ISSN 2198-3283
issn_series 1612-3956
copyrightSpringer Nature Switzerland AG 2019
The information of publication is updating

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發(fā)表于 2025-3-21 22:38:09 | 只看該作者
Nanoelectronic Coupled Problems Solutions978-3-030-30726-4Series ISSN 1612-3956 Series E-ISSN 2198-3283
板凳
發(fā)表于 2025-3-22 03:16:40 | 只看該作者
E. Jan W. ter Maten,Hans-Georg Brachtendorf,HerberCombines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault Simulation.Uniq
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發(fā)表于 2025-3-22 08:05:19 | 只看該作者
EM-Equations, Coupling to Heat and to Circuitse considered, in particular: (1) the coupling of electromagnetic fields with circuits and (2) the electro-thermal coupling in power transistors. These cases are not exhaustive but are used as typical for identifying generic guidelines for addressing coupled problems.
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發(fā)表于 2025-3-22 10:23:41 | 只看該作者
Bond Wire Modelse bond wire properties, e.g., its time to failure. Secondly, a more accurate model using the finite integration technique for spatial discretisation is constructed. This model is also used to study the impact of manufacturing uncertainties, e.g., variable bond wire lengths, on the performance of bond wires.
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發(fā)表于 2025-3-22 16:46:46 | 只看該作者
Discretizationspproach. Furthermore the set up of coupled problems is addressed. Finally, it is shown that discretization requires a careful handling of the various terms in the discretization procedure, otherwise numerical unstable equations will appear.
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https://doi.org/10.1007/978-3-030-30726-4multirate; model order reduction; co-simulation; uncertainty quantification; power-MOS devices; RF-circui
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Book 2019bility in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-le
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