| 書目名稱 | Memory Functions, Projection Operators, and the Defect Technique | | 副標(biāo)題 | Some Tools of the Tr | | 編輯 | V. M. (Nitant) Kenkre | | 視頻video | http://file.papertrans.cn/631/630470/630470.mp4 | | 概述 | Presents the first dedicated book treatment of memory functions, projection operators, the defect technique, and connections between them.Illustrated with a large set of applications taken from divers | | 叢書名稱 | Lecture Notes in Physics | | 圖書封面 |  | | 描述 | .This book provides a graduate-level introduction to three powerful and closely related techniques in condensed matter physics: memory functions, projection operators, and the defect technique. Memory functions appear in the formalism of the generalized master equations that express the time evolution of probabilities via equations non-local in time, projection operators allow the extraction of parts of quantities, such as the diagonal parts of density matrices in statistical mechanics, and the defect technique allows solution of transport equations in which the translational invariance is broken in small regions, such as when crystals are doped with impurities. These three methods combined form an immensely useful toolkit for investigations in such disparate areas of physics as excitation in molecular crystals, sensitized luminescence, charge transport, non-equilibrium statistical physics, vibrational relaxation, granular materials, NMR, and even theoretical ecology. This book explains the three techniques and their interrelated nature, along with plenty of illustrative examples. Graduate students beginning to embark on a research project in condensed matter physics will find this | | 出版日期 | Textbook 2021 | | 關(guān)鍵詞 | Memory function technique; Memory formalism; Zwanzig’s projection operators; the projection technique; M | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-030-68667-3 | | isbn_softcover | 978-3-030-68666-6 | | isbn_ebook | 978-3-030-68667-3Series ISSN 0075-8450 Series E-ISSN 1616-6361 | | issn_series | 0075-8450 | | copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl |
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