| 書目名稱 | Laboratory Micro-X-Ray Fluorescence Spectroscopy |
| 副標(biāo)題 | Instrumentation and |
| 編輯 | Michael Haschke |
| 視頻video | http://file.papertrans.cn/581/580302/580302.mp4 |
| 概述 | Gives a description of the main instrumental influences on the analytical performance.Discusses the different quantification models of X-ray measurements considering the special requirements to the an |
| 叢書名稱 | Springer Series in Surface Sciences |
| 圖書封面 |  |
| 描述 | Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a μ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. |
| 出版日期 | Book 2014 |
| 關(guān)鍵詞 | Components of X-ray Spectrometers; Distribution Analysis; Examination of Bulk Samples and Layer System |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-04864-2 |
| isbn_softcover | 978-3-319-35302-9 |
| isbn_ebook | 978-3-319-04864-2Series ISSN 0931-5195 Series E-ISSN 2198-4743 |
| issn_series | 0931-5195 |
| copyright | Springer International Publishing Switzerland 2014 |
|Archiver|手機(jī)版|小黑屋|
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