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Titlebook: IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials; Proceedings of the I Meinhard Kuna,Andreas Rico

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31#
發(fā)表于 2025-3-26 22:11:23 | 只看該作者
32#
發(fā)表于 2025-3-27 04:53:52 | 只看該作者
The Concept of Material Forces in Nonlinear Electro-elastostatics,l in crack problems. The formulations of material forces take into account the contribution of the outer space surrounding the body under consideration. It is shown that the contribution of the outer space is of importance when the polarization is relatively weak, for example in the case of electron
33#
發(fā)表于 2025-3-27 07:39:16 | 只看該作者
34#
發(fā)表于 2025-3-27 10:49:18 | 只看該作者
35#
發(fā)表于 2025-3-27 16:28:06 | 只看該作者
Singularity Analysis of Electro-mechanical Fields in Angularly Inhomogeneous Piezoelectric Composit (AGPM) and under anti-plane deformation. The analysis is based on the mixed-variable state space formulation developed in this paper. The characteristic equation containing the singular order is derived using the method of variable separation. The results presented demonstrate the effects of the an
36#
發(fā)表于 2025-3-27 20:17:47 | 只看該作者
37#
發(fā)表于 2025-3-28 01:05:36 | 只看該作者
Periodic Set of the Interface Cracks with Limited Electric Permeability,terface cracks is considered. Uniformly distributed electromechanical loading is applied. The solution of the problem is obtained in close form by use of complex function theory. Formulae for stresses, electric displacement vector, elastic displacements and electric potential jump at the interface a
38#
發(fā)表于 2025-3-28 04:04:31 | 只看該作者
Interfacial Delamination of PZT Thin Films,ed cantilever specimen is proposed to perform the delamination tests. The experimental results show that the multilayered Cr/PZT/PLT/Pt/Ti thin films deposited on single-crystal silicon substrates are delaminated along the interface between Cr and PZT layers in a brittle manner. Second, based on coh
39#
發(fā)表于 2025-3-28 06:31:27 | 只看該作者
Mechanical Behavior of Thin Film Comprised of Sculptured Nano-elements,cretely arrayed nano-elements on a substrate is evaluated by means of an atomic force microscope (AFM) with a loading apparatus. The fact that the thin film eliminates stress singular field at the interface edge between dissimilar materials is numerically and experimentally elucidated.
40#
發(fā)表于 2025-3-28 13:18:29 | 只看該作者
Meinhard Kuna,Andreas RicoeurIUTAM Symposia represents the state of the art in their topic and set the standard for the next 3-5 years.Includes supplementary material:
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