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Titlebook: High Resolution Focused Ion Beams: FIB and its Applications; The Physics of Liqui Jon Orloff,Mark Utlaut,Lynwood Swanson Book 2003 Springer

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發(fā)表于 2025-3-21 16:27:45 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱High Resolution Focused Ion Beams: FIB and its Applications
副標(biāo)題The Physics of Liqui
編輯Jon Orloff,Mark Utlaut,Lynwood Swanson
視頻videohttp://file.papertrans.cn/427/426476/426476.mp4
圖書封面Titlebook: High Resolution Focused Ion Beams: FIB and its Applications; The Physics of Liqui Jon Orloff,Mark Utlaut,Lynwood Swanson Book 2003 Springer
描述In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. .The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject. .
出版日期Book 2003
關(guān)鍵詞liquid; metals; optics; physics
版次1
doihttps://doi.org/10.1007/978-1-4615-0765-9
isbn_softcover978-1-4613-5229-7
isbn_ebook978-1-4615-0765-9
copyrightSpringer Science+Business Media New York 2003
The information of publication is updating

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Field Ionization Sources,urface analytical tools capable of atomic imaging (for a thorough discussion of the FIM and principles of operation, see the monographs by Müller and Tsong [Müller, 1969] and Gomer [Gomer, 1961]). A GFIS developed by Orloff and Swanson for focused beam work is shown in Figure 1.1.
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Practical Focused Ion Beam Optics and Systems,f beam self-interactions, practical aspects of electrostatic lens design and manufacture, and beam deflection techniques. We will cover how the performance of the column is measured and calculated for various situations. The issues of detectors for image formation, and remedies for charging samples will also be addressed.
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the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. .The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in th
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he benefits and bottlenecks of this rendering model are. We answer the question of whether it would be possible to design a software rendering engine to meet the requirements of today’s computer games.
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