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Titlebook: Embracing Industry 4.0; Selected Articles fr Mohd Azraai Mohd Razman,Jessnor Arif Mat Jizat,Moh Conference proceedings 2020 Springer Nature

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31#
發(fā)表于 2025-3-26 20:59:53 | 只看該作者
A Mutation Triggering Method for Genetic Algorithm to Solve Traveling Salesman Problem,ws that the proposed method was able to find a better solution (travel cost) than the other approaches. For computation time, the proposed strategy did as well as other mutation strategies. ?In conclusion, the combination of several mutation operators can ensure the benefits of diversity as well as the benefits of faster convergence.
32#
發(fā)表于 2025-3-27 04:04:06 | 只看該作者
Flat Price Prediction Using Linear and Random Forest Regression Based on Machine Learning Technique the validity of the model using boxplot analysis, residual analysis, error checking and cross-validation. Finally, the performance of two methods has been compared which shows that the random forest regression model gives the best prediction result than the linear regression model.
33#
發(fā)表于 2025-3-27 05:25:59 | 只看該作者
34#
發(fā)表于 2025-3-27 09:44:32 | 只看該作者
35#
發(fā)表于 2025-3-27 14:37:48 | 只看該作者
Lecture Notes in Electrical Engineeringhttp://image.papertrans.cn/e/image/308041.jpg
36#
發(fā)表于 2025-3-27 20:47:05 | 只看該作者
https://doi.org/10.1007/978-3-031-06685-6all over the world. On the other hand, assessment plays an important role to improve student performance in MOOC learning. However, issues in assessment designs contribute to the lack of student engagement. Hence, a suitable assessment model should be developed to improve student performance in MOOC
37#
發(fā)表于 2025-3-27 23:31:07 | 只看該作者
38#
發(fā)表于 2025-3-28 02:18:56 | 只看該作者
39#
發(fā)表于 2025-3-28 08:31:32 | 只看該作者
Mindfulness and Meditation for AdolescentsThe Silicon nanogap was fabricated using the top–down conventional lithography approach followed by reactive ion etching (RIE) to further thin down the nanogap. The inspections of Silicon nanogap structures were carried out using the scanning electron microscope (SEM) and atomic force microscopy (AF
40#
發(fā)表于 2025-3-28 11:39:06 | 只看該作者
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