Titlebook: Electron and Ion Optics; Miklos Szilagyi Book 1988 Plenum Press, New York 1988 Wafer.analog.circuit.computer.electromagnetic field.electro

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Focusing with Axially Symmetric Fields, symmetric lenses of light optics, the basic properties of which were introduced in Section 1-4-2. The existence of the electron optical index of refraction (Section 2-6) proves the possibility of producing electron and ion lenses on the basis of the close analogy between light optics and the motion

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Beam Deflection,chines, scanning electron microscopes, and some other analytical instruments. Its purpose is to . the beam over a surface. The main feature of this type of deflection is that the undeflected beam has a ., therefore the analysis of deflection can be based on the principles used in the previous chapte

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