標題: Titlebook: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide; Trent McConaghy,Kristopher Breen,Amit Gupta Book 2013 Spring [打印本頁] 作者: 解毒藥 時間: 2025-3-21 19:47
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書目名稱Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide讀者反饋
書目名稱Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide讀者反饋學科排名
作者: 使更活躍 時間: 2025-3-21 21:04 作者: 黃瓜 時間: 2025-3-22 01:22 作者: BRACE 時間: 2025-3-22 07:58 作者: 時代 時間: 2025-3-22 10:46 作者: Congruous 時間: 2025-3-22 14:41 作者: Ambulatory 時間: 2025-3-22 20:18 作者: 進步 時間: 2025-3-22 21:47 作者: 偏狂癥 時間: 2025-3-23 04:02
Trent McConaghy,Kristopher Breen,Jeffrey Dyck,Amit Guptapresented by values representing the number of TIRP’s instances that were detected. Then, the iTirps representation is fed into a Deep Learning Architecture, which can learn this kind of sequential relations, using a Recurrent Neural Network (RNN) or a Convolutional Neural Network (CNN). Finally, we作者: 不能和解 時間: 2025-3-23 07:52 作者: confederacy 時間: 2025-3-23 11:02 作者: 熟練 時間: 2025-3-23 15:09 作者: ALLAY 時間: 2025-3-23 18:51 作者: 健忘癥 時間: 2025-3-24 00:51 作者: QUAIL 時間: 2025-3-24 05:11 作者: tariff 時間: 2025-3-24 07:23
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide作者: 詞匯 時間: 2025-3-24 13:46
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide978-1-4614-2269-3作者: FLIP 時間: 2025-3-24 16:22
3-Sigma Verification and Design,acteristics. It then describes the key algorithms needed to enable the sigma-driven corner flow, namely sigma-driven corner extraction and confidence-based statistical verification. Some enabling technologies include Monte Carlo, Optimal Spread Sampling, confidence intervals, and 3σ corner extraction.作者: laceration 時間: 2025-3-24 22:25
Conclusion, coverage, to design precisely for 3-sigma statistical design, or to achieve true high-sigma statistical designs without unnecessarily spinning silicon or over-margining. Being able to select and apply an appropriate methodology is an important component of being able to deliver competitive, high yield products reliably and on time.作者: 遷移 時間: 2025-3-24 23:26
High-Sigma Verification and Design,le results for representative high-sigma designs, revealing some of the key traits that make the HSMC technology effective. It describes how to extract full PDFs from ?6 to +6 sigma, for application to statistical system-level analysis (e.g. for memory arrays). Finally, it presents industrial design examples.作者: colostrum 時間: 2025-3-25 04:18 作者: 禁令 時間: 2025-3-25 09:18 作者: 壓碎 時間: 2025-3-25 14:58 作者: landmark 時間: 2025-3-25 15:59
Fast PVT Verification and Design,emperature (PVT) variations are taken into account by individually varying P, V, and T over their allowable ranges and analyzing the subsequent combinations or so-called PVT corners. In modern designs, there can be hundreds or thousands of PVT corners. This chapter reviews design flows to handle PVT作者: 畢業(yè)典禮 時間: 2025-3-25 21:54
A Pictorial Primer on Probabilities,phical analysis as opposed to equations. Such intuition will help in many design scenarios, when one is observing actual PDF data in the form of scatterplots, histograms, and normal quantile (NQ) plots.作者: COW 時間: 2025-3-26 03:18 作者: Chandelier 時間: 2025-3-26 07:00 作者: 巧辦法 時間: 2025-3-26 09:50 作者: 主講人 時間: 2025-3-26 14:58 作者: 愛了嗎 時間: 2025-3-26 18:27
Book 2013uch as statistical process variations, environmental variations, and layout effects.? It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes 作者: 真實的你 時間: 2025-3-27 00:11
s of modern Variation-Aware tools and shows how to benchmarkThis book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.? It t作者: 小鹿 時間: 2025-3-27 04:15
Variation-Aware Design,orates the benefits of both manual and automated design, providing fast and thorough design exploration while allowing the designer to maintain full control over the design and providing more insight than ever.作者: Laconic 時間: 2025-3-27 06:05
978-1-4899-9673-2Springer Science+Business Media New York 2013作者: 慢跑 時間: 2025-3-27 10:29 作者: 艦旗 時間: 2025-3-27 14:18
Trent McConaghy,Kristopher Breen,Amit GuptaDocuments the state-of-the-art in industrial-scale, variation-aware, custom integrated circuit design.Describes the capabilities and benefits of modern Variation-Aware tools and shows how to benchmark作者: gimmick 時間: 2025-3-27 19:58 作者: Arthritis 時間: 2025-3-28 01:49
https://doi.org/10.1007/978-1-4614-2269-3Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variation作者: engrave 時間: 2025-3-28 05:55
A Pictorial Primer on Probabilities,phical analysis as opposed to equations. Such intuition will help in many design scenarios, when one is observing actual PDF data in the form of scatterplots, histograms, and normal quantile (NQ) plots.作者: Flagging 時間: 2025-3-28 10:21 作者: Conducive 時間: 2025-3-28 12:22
Preparing conventions for parameters for transportable numerical software,作者: 大雨 時間: 2025-3-28 18:35 作者: Juvenile 時間: 2025-3-28 21:39 作者: 領(lǐng)袖氣質(zhì) 時間: 2025-3-29 00:58
Current monitoring tools, however, do not offer adequate process visualization support. In particular, processes are always visualized in the way they were drawn by the process designer. This static approach is by far not sufficient when dealing with more complex scenarios where different user group
