標(biāo)題: Titlebook: Rapid Reliability Assessment of VLSICs; A. P. Dorey,B. K. Jones,Y. Z. Xu Book 1990 Plenum Press, New York 1990 CMOS.Modulation.VLSI.analog [打印本頁] 作者: 鳴叫大步走 時(shí)間: 2025-3-21 18:41
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書目名稱Rapid Reliability Assessment of VLSICs讀者反饋學(xué)科排名
作者: OASIS 時(shí)間: 2025-3-21 20:46
A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xug health-related quality of life research or also called patient-reported outcomes research..Since the 1960s two overlapping but fairly distinct research communities and traditions have developed concerning ideas about the quality of life, individually and collectively, one with a fairly narrow focu作者: 說不出 時(shí)間: 2025-3-22 00:54 作者: Crater 時(shí)間: 2025-3-22 05:57 作者: eardrum 時(shí)間: 2025-3-22 09:41
A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xuf quality of life from a multidisciplinary perspective.Inclu.The aim of this encyclopedia is to provide a comprehensive reference work on scientific and other scholarly research on the quality of life, including health-related quality of life research or also called patient-reported outcomes researc作者: ETHER 時(shí)間: 2025-3-22 13:25 作者: 上流社會 時(shí)間: 2025-3-22 17:50 作者: 幼稚 時(shí)間: 2025-3-22 21:58 作者: SLAG 時(shí)間: 2025-3-23 05:25
Book 1990ds of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measurements that may reveal those devices more likely to fail. The measurements assessed are of analog circuit parameters which, based on a knowledge of fa作者: Supplement 時(shí)間: 2025-3-23 08:54 作者: Radiation 時(shí)間: 2025-3-23 09:54 作者: noxious 時(shí)間: 2025-3-23 14:27 作者: Tortuous 時(shí)間: 2025-3-23 21:08 作者: 流浪 時(shí)間: 2025-3-24 01:14 作者: 萬花筒 時(shí)間: 2025-3-24 03:21
Introduction to VLSI Testing,ich the circuit is used. However, in some applications where the replacement cost is high or the consequences of failure are serious, highly reliable devices of high quality are needed. Examples of such uses are in satellites, undersea cable, remote stations, manned space vehicles and for military systems.作者: 平 時(shí)間: 2025-3-24 07:12 作者: Mundane 時(shí)間: 2025-3-24 10:51
Assessment of the Tests as Predictors of Failure,In this section we will illustrate the usefulness of the devised tests by referring to the behavior of the devices subject to thermal and electrical stress. Before we discuss this in detail in the next few subsections we first of all introduce the experimental details for reference.作者: Derogate 時(shí)間: 2025-3-24 18:11
http://image.papertrans.cn/r/image/821217.jpg作者: PANG 時(shí)間: 2025-3-24 22:59 作者: craven 時(shí)間: 2025-3-25 01:11
The Devices Studied and their Simulation,cuit simulation package, PSPICE (Microsim Corporation), which i3 a version written for use on the IBM personal computer. The simulations gave the size and shape of the waveforms occuring in the circuits being studied and the effect of different conditions within the circuit on these waveforms.作者: Malaise 時(shí)間: 2025-3-25 06:53
Conclusions,and have been proposed, we have described and used a set of tests which are sensitive to degradation of the circuit quality, are convenient to use, give results which can be readily interpreted and have potential for incorporation into an industrial environment using standard equipment.作者: ligature 時(shí)間: 2025-3-25 09:10
978-1-4612-7879-5Plenum Press, New York 1990作者: concert 時(shí)間: 2025-3-25 13:19 作者: 弄臟 時(shí)間: 2025-3-25 19:14 作者: Erythropoietin 時(shí)間: 2025-3-25 20:49 作者: 外星人 時(shí)間: 2025-3-26 04:09 作者: 有其法作用 時(shí)間: 2025-3-26 08:19
Book 1990 measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently作者: CLASP 時(shí)間: 2025-3-26 09:25
ity of the measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently978-1-4612-7879-5978-1-4613-0587-3作者: 草率女 時(shí)間: 2025-3-26 14:54 作者: cuticle 時(shí)間: 2025-3-26 17:45
A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xually and cover basic concepts, relatively well established facts, lawlike and causal relations, theories, methods, standardized tests, biographic entries on significant figures, organizational profiles, indicat978-94-007-0753-5作者: 后來 時(shí)間: 2025-3-26 21:22
A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xually and cover basic concepts, relatively well established facts, lawlike and causal relations, theories, methods, standardized tests, biographic entries on significant figures, organizational profiles, indicat978-94-007-0753-5作者: 有權(quán)威 時(shí)間: 2025-3-27 01:10
A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xually and cover basic concepts, relatively well established facts, lawlike and causal relations, theories, methods, standardized tests, biographic entries on significant figures, organizational profiles, indicat978-94-007-0753-5作者: Talkative 時(shí)間: 2025-3-27 09:05 作者: 意外的成功 時(shí)間: 2025-3-27 12:33 作者: 小母馬 時(shí)間: 2025-3-27 14:19
The Accounts of Intersectoral Trade and Financial Flows financial account is conducive to analysing the causes and determinants of IRF. The data on commodity flows are relatively complete, but that does not mean that they do not contain errors. The data on financial flows are more difficult to obtain. As Nolan and White have pointed out:作者: heart-murmur 時(shí)間: 2025-3-27 21:44
Larry A. Swatuk,Corrine Cash compounds. The Supplement Volumes A 2, A 3, A 4, and A 5 with the history, isotopes, uses, the recovery of thorium and general properties of thorium atom and ions, the thermodynamics of its compounds and solutions, spectroscopic data and analytical chemistry, biological behavior, health protection 作者: 蛛絲 時(shí)間: 2025-3-27 22:14
Mobilit?tsverhalten in der Freizeithttp://image.papertrans.cn/m/image/639630.jpg
