標(biāo)題: Titlebook: Design, Analysis and Test of Logic Circuits Under Uncertainty; Smita Krishnaswamy,Igor L. Markov,John P. Hayes Book 2013 Springer Science+ [打印本頁] 作者: polysomnography 時間: 2025-3-21 16:58
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作者: vitreous-humor 時間: 2025-3-22 00:15 作者: Virtues 時間: 2025-3-22 00:45
Computing with Probabilistic Transfer Matrices,for PTM operations that can operate directly on the compressed forms and compute circuit error probabilities. We also develop methods to handle non-square matrices, which have not been represented as decision diagrams in the prior literature.We present several heuristic methods for further improving作者: 一起 時間: 2025-3-22 07:33 作者: Mammal 時間: 2025-3-22 12:40
Signature-Based Reliability Analysis,acy. To address this challenge, we present AnSER, our linear-time method for logic-level soft-error analysis. AnSER achieves its low runtimes by means of functional simulation signatures, which enable a fast and accurate method for computing signal probability and observability, even in the presence作者: 編輯才信任 時間: 2025-3-22 15:54
Design for Robustness,f the interplay between signal probability, observability, and masking mechanisms. The first technique, called SiDeR, involves finding logical implications between signals, using logic simulation signatures to reduce SER. In our second technique, several alternate non-redundant realizations of the s作者: 編輯才信任 時間: 2025-3-22 20:04 作者: SENT 時間: 2025-3-23 00:43
Fast and Slow Enigmas and Parental GuidanceThis chapter summarizes the research presented in the preceding chapters and suggests some possible ways in which it might be extended further for new applications, such as the analysis of process variations in logic circuits, and the analysis of biological networks.作者: 微不足道 時間: 2025-3-23 03:42
Summary and Extensions,This chapter summarizes the research presented in the preceding chapters and suggests some possible ways in which it might be extended further for new applications, such as the analysis of process variations in logic circuits, and the analysis of biological networks.作者: Ophthalmoscope 時間: 2025-3-23 09:21 作者: myriad 時間: 2025-3-23 12:15
978-94-007-9798-7Springer Science+Business Media Dordrecht 2013作者: 整潔 時間: 2025-3-23 16:06
Superposition with Structural Induction other defects. Over time, IC technology scaling has heightened device sensitivity to a different kind of error, known as a soft, or transient errors. Soft errors are caused by external noise or radiation that temporarily affects circuit behavior without permanently damaging the hardware. With the a作者: dearth 時間: 2025-3-23 19:57 作者: 折磨 時間: 2025-3-24 01:15 作者: 喃喃訴苦 時間: 2025-3-24 03:32 作者: 時間等 時間: 2025-3-24 10:30
Lecture Notes in Computer Scienceacy. To address this challenge, we present AnSER, our linear-time method for logic-level soft-error analysis. AnSER achieves its low runtimes by means of functional simulation signatures, which enable a fast and accurate method for computing signal probability and observability, even in the presence作者: thwart 時間: 2025-3-24 11:33 作者: MIRTH 時間: 2025-3-24 15:19
Smita Krishnaswamy,Igor L. Markov,John P. HayesPresents a comprehensive overview of Logic Circuits.Combines theory with practical examples.Multi-discipline approach to the "hot" topic of uncertainty.Includes supplementary material: 作者: Oration 時間: 2025-3-24 23:05
Lecture Notes in Electrical Engineeringhttp://image.papertrans.cn/d/image/268801.jpg作者: 凹處 時間: 2025-3-25 00:30 作者: 紳士 時間: 2025-3-25 04:52
Computing with Probabilistic Transfer Matrices,uare matrices, which have not been represented as decision diagrams in the prior literature.We present several heuristic methods for further improving the scalability of PTMs, including sampling, partitioning, evaluation ordering, and hierarchical computations, which allow PTM computations to scale to larger circuits.作者: GRIPE 時間: 2025-3-25 11:27
Book 2013its despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.作者: Odyssey 時間: 2025-3-25 13:46
Warren Del-Pinto,Renate A. Schmidtand compaction methods for probabilistic faults, with the goals of estimating and bounding fault detection probabilities. These methods use integer linear programming (ILP) to optimize test sets. The results show that our methods can generate tests quickly and require only half as many (repeated) vectors as testing with random patterns.作者: Oration 時間: 2025-3-25 19:10 作者: 不妥協(xié) 時間: 2025-3-25 21:45
Book 2013ntly probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis作者: 詞匯表 時間: 2025-3-26 03:35 作者: Glower 時間: 2025-3-26 08:17
A Neurally-Guided, Parallel Theorem Proveruare matrices, which have not been represented as decision diagrams in the prior literature.We present several heuristic methods for further improving the scalability of PTMs, including sampling, partitioning, evaluation ordering, and hierarchical computations, which allow PTM computations to scale to larger circuits.作者: 首創(chuàng)精神 時間: 2025-3-26 11:16 作者: 壓迫 時間: 2025-3-26 13:35
Lecture Notes in Computer Sciencemonstrate results on IWLS and ISCAS benchmarks, which generally show 2-3 orders of magnitude speed-up over previous SER analyzers and high accuracy when validated against a state-of-the-art ATPG tool.作者: 事情 時間: 2025-3-26 18:27
Mnacho Echenim,Nicolas Peltier,Yanis Sellamis in timing masking, by relocating gates physically to minimize their error-latching windows. The last technique is a form of register retiming that minimizes the probability that soft errors are propagated to a primary output. Our results generally show significant and low-cost improvements in SER.作者: 火光在搖曳 時間: 2025-3-27 00:42 作者: collagenase 時間: 2025-3-27 04:41 作者: Inexorable 時間: 2025-3-27 06:43
Superposition with Structural Inductionncreased vulnerability to soft errors and other sorts of uncertainty in circuit behavior. We also provide an overview of previous work on soft-error rate (SER) analysis, fault-tolerant design, soft-error rate testing, and probabilistic circuit analysis.作者: 擺動 時間: 2025-3-27 13:06
A Neurally-Guided, Parallel Theorem Provere use of PTMs in capturing various sorts of errors inherent in nanocircuits.We also show the use of PTMs in deriving polynomial approximations for circuit error probabilities in terms of gate error probabilities for the purpose of determining thresholds of acceptable gate error for specific circuits.作者: 嫌惡 時間: 2025-3-27 15:53
Introduction,ncreased vulnerability to soft errors and other sorts of uncertainty in circuit behavior. We also provide an overview of previous work on soft-error rate (SER) analysis, fault-tolerant design, soft-error rate testing, and probabilistic circuit analysis.作者: 詞匯表 時間: 2025-3-27 18:07 作者: Wallow 時間: 2025-3-28 00:09
Reality?. Marcel Leroux seeks to separate fact from fiction in this critical debate from a climatological perspective. Beginning with a review of the dire hypotheses for climate trends, the author describes the history of the 1998 Intergovernmental Panel on Climate Change (IPCC) and many subsequent作者: 粗鄙的人 時間: 2025-3-28 05:08
