標題: Titlebook: Analytical Methods and Instruments for Micro- and Nanomaterials; Henry H. Radamson,Anders Hallén,Alexander Azarov Book 2023 Springer Natur [打印本頁] 作者: Clique 時間: 2025-3-21 18:35
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials影響因子(影響力)
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials影響因子(影響力)學科排名
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials網絡公開度
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials網絡公開度學科排名
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials被引頻次
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials被引頻次學科排名
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials年度引用
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials年度引用學科排名
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials讀者反饋
書目名稱Analytical Methods and Instruments for Micro- and Nanomaterials讀者反饋學科排名
作者: arthroscopy 時間: 2025-3-21 22:37
Micro-photoluminescence (μ-PL)t photons. New photons can then be emitted, as the excited electrons relaxes back to their ground states and the emitted photons can reveal important information of the electronic system of the material. Micro-photoluminescence, described in this chapter, is a versatile technique for characterizatio作者: ANTIC 時間: 2025-3-22 00:50
Raman Spectroscopy, Fourier Transform Infrared Spectroscopy (FTIR) and X-Ray Photoelectron Spectroscectroscopy (XPS) techniques. These methods are other important varieties of using incident photons to study electronic and vibrational properties of materials, in addition to photoluminescence, described in Chap. .. The discussion in this chapter covers the scientific and technical issues while seve作者: 滔滔不絕地講 時間: 2025-3-22 05:27
Electron Microscopyque of electron spectroscopy developed to scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for material analysis. A focus is made on electron diffraction and chemical analysis methods e.g. energy dispersive spectroscopy (EDS) and electron energy loss spectroscopy (EELS) 作者: 政府 時間: 2025-3-22 11:36
Rutherford Backscattering Spectrometryntieth century that paved the way to modern physics and our conception of matter. From fundamental research in nuclear physics, RBS developed into a very useful material characterization technique for investigation of thin film composition, depth profiling of impurities, and thickness measurement in作者: Biomarker 時間: 2025-3-22 14:16
Secondary Ion Mass Spectrometry (SIMS)lity for detection of low concentrations of practically any element of the periodic table with large spatial resolution. At present time SIMS is a primary tool used in both industry and research areas and also highly relevant for analysis of nano-scaled materials. However, SIMS is a quite complicate作者: NICHE 時間: 2025-3-22 19:07 作者: 嘲弄 時間: 2025-3-22 21:20
Scanning Probe Microscopies (SPMs)ontact modes. In contrast to SEM, AFM provides very accurate and direct surface topography measurements, down to atomic resolution. Apart from sensing the surface roughness, SPM allows for analyzing for instance optical, electric, or magnetic interactions down to the atomic scale and the technique h作者: 警告 時間: 2025-3-23 04:11
Pauline Charlotte Marguerite ReineckeLater, the discussions extend also to scanning Moiré fringe (SMF) imaging technique and how to determine the lattice plane direction and crystal quality. Finally, different examples of applications of electron microscopes for nano-scale materials and devices are presented.作者: 完成才能戰(zhàn)勝 時間: 2025-3-23 08:28
Electron MicroscopyLater, the discussions extend also to scanning Moiré fringe (SMF) imaging technique and how to determine the lattice plane direction and crystal quality. Finally, different examples of applications of electron microscopes for nano-scale materials and devices are presented.作者: sacrum 時間: 2025-3-23 10:12 作者: moribund 時間: 2025-3-23 17:42
Cheryce Kramer,Helmut Müller-Sieverscts, x-ray diffraction, and then the discussion extend to the x-ray applications for material analysis ranging from powder diffraction, and grazing-angle reflectivity measurements to high-resolution measurements. The content gives also examples for how to apply x-ray diffraction to study the nano-scale materials and devices.作者: 我要沮喪 時間: 2025-3-23 18:35 作者: 小樣他閑聊 時間: 2025-3-24 00:02 作者: notice 時間: 2025-3-24 03:49 作者: conservative 時間: 2025-3-24 10:00 作者: 無聊的人 時間: 2025-3-24 13:39 作者: 縮短 時間: 2025-3-24 18:04 作者: Restenosis 時間: 2025-3-24 20:37 作者: APRON 時間: 2025-3-25 00:30
Das Beste, was du wissen kannst,n and studies of material optical properties on a smaller length scale. Basic principles and instrumentation are described and relevant examples are provided for heterostructures and nanostructured semiconductor materials with the focus on analysis of fundamental properties relevant for today’s applications.作者: 我們的面粉 時間: 2025-3-25 05:27 作者: 不知疲倦 時間: 2025-3-25 08:19 作者: 胎兒 時間: 2025-3-25 13:28
Book 2023semiconductor materials, metals and oxides.?..The book serves as a valuable guide for scientists and students working in materials science, physics,?and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials. ?.作者: 榮幸 時間: 2025-3-25 16:32
Henry H. Radamson,Anders Hallén,Alexander AzarovBrings together all the main analytical instruments and techniques used for nanomaterials.Elucidates the link between analytical instruments and technology roadmap.Discusses the peculiar difficulties 作者: 無彈性 時間: 2025-3-25 20:40 作者: 鼓掌 時間: 2025-3-26 01:29
https://doi.org/10.1007/978-3-031-26434-4Quantum dots, quantum wells and nanowires; Nano-electronics and nano-photonics; Nanomaterials properti作者: ARCH 時間: 2025-3-26 06:36
978-3-031-26436-8Springer Nature Switzerland AG 2023作者: 令人不快 時間: 2025-3-26 09:45 作者: venous-leak 時間: 2025-3-26 14:42 作者: hemoglobin 時間: 2025-3-26 18:04 作者: 腐爛 時間: 2025-3-26 22:38 作者: 可轉變 時間: 2025-3-27 05:12
https://doi.org/10.1007/978-3-476-03256-0ntieth century that paved the way to modern physics and our conception of matter. From fundamental research in nuclear physics, RBS developed into a very useful material characterization technique for investigation of thin film composition, depth profiling of impurities, and thickness measurement in作者: Palter 時間: 2025-3-27 06:41
https://doi.org/10.1007/978-3-476-03256-0lity for detection of low concentrations of practically any element of the periodic table with large spatial resolution. At present time SIMS is a primary tool used in both industry and research areas and also highly relevant for analysis of nano-scaled materials. However, SIMS is a quite complicate作者: integral 時間: 2025-3-27 12:22 作者: 笨重 時間: 2025-3-27 14:06 作者: 官僚統治 時間: 2025-3-27 18:34 作者: 富足女人 時間: 2025-3-28 01:24 作者: MUTED 時間: 2025-3-28 03:17 作者: 進入 時間: 2025-3-28 07:42
https://doi.org/10.1007/978-3-476-03256-0 that the main types of modern SIMS instruments are reviewed, describing the different primary ion sources and the variety of mass spectrometers for detecting secondary ions. Finally, the main operation modes of SIMS instruments are described in conjunction with examples of SIMS applications with co作者: countenance 時間: 2025-3-28 14:05
Deutsche Einheit: Ein neuer Diskurs diffraction limit, allows near-field based techniques to obtain sample information with a high spatial resolution. In this chapter basic principles, operation modes, and standard equipment for this method are discussed. Examples of applications to the nano- and micro-scale materials illustrate how
